Secondary Ion Mass Spectrometry

An Introduction to Principles and Practices
Product Number: EB00545902
Released: Sep 03, 2014
Business Term: Purchase
ISBN: #9781118916773
Publisher: Wiley
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Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) - Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations - Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission - Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) - Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions - Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

Author(s): Paul van der Heide
Genre: Science
Original Publish Date: Aug 19, 2014

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