Conductive Atomic Force Microscopy

Applications in Nanomaterials
Genre: Science
Original Publish Date: Aug 03, 2017
Product Number: EB00711437
Released: Sep 07, 2017
Business Term: Purchase
ISBN: #9783527699797
Publisher: Wiley-VCH
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The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

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